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1

[Inst. Electr. Eng. Japan 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 - Osaka, Japan (4-7 June 2001)] Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) - Power BiCMOS process with high voltage device implementation for 20 V mixed signal circuit applications

Nehrer, W., Anderson, L., Debolske, T., Efland, T., Fleischmann, P., Haidinyak, C., Leitz, W., McNutt, M., Mindricelu, E., Pendharkar, S., Smith, J., Taylor, R.V.

Year:

2001

Language:

english

File:

PDF, 410 KB

english, 2001

2

[IEEE IEEE 1995 International Integrated Reliability Workshop. Final Report - Lake Tahoe, CA, USA (22-25 Oct. 1995)] IEEE 1995 International Integrated Reliability Workshop. Final Report - A case study in a 100×reduction in sodium ions in a 0.8 μm BiCMOS process using triangular voltage sweep

Anderson, L., Parikh, S., Nagalingam, S., Haidinyak, C.

Year:

1995

Language:

english

File:

PDF, 467 KB

english, 1995

3

[IEEE 7th International Symposium on Quality Electronic Design (ISQED'06) - San Jose, CA, USA (27-29 March 2006)] 7th International Symposium on Quality Electronic Design (ISQED'06) - Process Window and Device Variations Evaluation using Array-Based Characterization Circuits

Tabery, C., Craig, M., Burbach, G., Wagner, B., McGowan, S., Etter, P., Roling, S., Haidinyak, C., Ehrichs, E.

Year:

2006

Language:

english

File:

PDF, 732 KB

english, 2006

4

SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Still-Image Compression - Experiments in lossless and virtually lossless image-compression algorithms

Langdon, Jr., Glen G., Haidinyak, Chris A., Rabbani, Majid, Delp, Edward J., Rajala, Sarah A.

Year:

1995

Language:

english

File:

PDF, 293 KB

english, 1995

5

Donʼt Let the Grievance Process Cause Grief

Haidinyak, Gina, Walker, Glenda C.

Journal:

Year:

2005

Language:

english

File:

PDF, 61 KB

english, 2005

6

Try a Mock Trial

Haidinyak, Gina

Journal:

Year:

2006

Language:

english

File:

PDF, 711 KB

english, 2006

7

Case History Number 95

HAIDINYAK, JOHN G., DIDIER, EDWARD P.

Journal:

Anesthesia & Analgesia

Year:

1977

Language:

english

File:

PDF, 285 KB

english, 1977

8

SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Applications of Digital Image Processing XVII - Context-dependent distribution shaping and parameterization for lossless image compression

Langdon, Jr., Glen G., Haidinyak, Chris A., Tescher, Andrew G.

Year:

1994

Language:

english

File:

PDF, 389 KB

english, 1994

9

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Design-based metrology: advanced automation for CD-SEM recipe generation

Tabery, C., Silver, Richard M., Capodieci, L., Haidinyak, C., Shah, K., Threefoot, M., Choo, B., Singh, B., Nehmadi, Y., Ofek, C., Menadeva, O., Ben-Porath, A.

Year:

2005

Language:

english

File:

PDF, 637 KB

english, 2005

10

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 13 September 2004)] 24th Annual BACUS Symposium on Photomask Technology - Applications using 2D contact CDSEM images

Haidinyak, Chris A., Staud, Wolfgang, Weed, J. Tracy, Tabery, Cyrus E.

Year:

2004

Language:

english

File:

PDF, 1.10 MB

english, 2004